Panel Mura Inspection
Unevenness inspection device

overview

・ Slit unevenness of LCD panel / OLED panel,

Inspection of area unevenness, spot unevenness, etc. is possible.

・ Comparison of each abnormality with the reference data and adjacent areas

Judgment of pass / fail through comparison with.

・ High-resolution inspection Sub-micro-class inspection for micro defects

Technology.

-Fatal defect extraction and classification.

・ High-speed review technology for minute defects.

・ Optical system development, especially for OLED panels

Optical system development technology specialized for flexible processes.

・ Takayasu by using our own development control software

qualitative.

・ Mass production equipment for domestic and overseas customers (Japan, China, South Korea)

As a result, there are many achievements.

* Please contact us for detailed structure and specifications.